Article

Contact

Multi-technique Demonstration Video - PHI 710 Scanning Auger Nanoprobe

In this brief demonstration, Auger electron spectroscopy (AES) is utilized in conjunction with Energy Dispersive X-ray Spectroscopy (EDS) and Focused Ion Beam (FIB) on the PHI 710 Multi-technique Scanning Auger Nanoprobe. The complementary nature of the techniques allows for a buried metal particle to be first located and quickly characterized with EDS and subsequently FIB milled then mapped in situ with high spatial resolution Auger imaging.

18725 Lake Drive East, Chanhassen, MN 55317
© 2024 Physical Electronics, Inc. (PHI) All Rights Reserved.
© 2024 Physical Electronics, Inc. (PHI) All Rights Reserved.