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Driving Discoveries Through Surface Analysis with PHI Analytical Services

At PHI, we often receive requests that begin with a specific surface analysis technique in mind:
“Can you perform XPS on this?” or “We’d like TOF-SIMS on that.”

While there are certainly cases where a specific method is appropriate, we’ve learned that insightful discoveries often come when we start with the goal instead of a specific technique. That’s why our lab is organized as a collaborative, multi-technique strategy with our customers at the heart of our lab so that they walk away not with “I think,” but “I know.”

For example, XPS provides elemental and chemical-state information within the top few nanometers across micrometer- to millimeter-scale areas. TOF-SIMS builds on that by offering unrivaled molecular fingerprints of the surface while AES delivers high-resolution nanoscale elemental mapping beyond the capabilities of TOF-SIMS and XPS. Whether used individually or together, these techniques provide a more complete picture of the complex surface landscape.

The surface has become increasingly important as it is now the frontier of emerging technologies. From biomedical coatings to semiconductor stacks and polymer blends, subtle surface interactions often dictate whether a product is high-performing or failing. Surfaces are also rarely simple.

PHI’s approach ensures we capture the full story, from elemental composition to molecular architecture of the surface. We invite you to explore this philosophy and discover how surface analysis can support your materials challenges by visiting our new PHI Analytical Services webpage.