Surface analysis techniques that analyze the top few atomic layers of materials play an essential role in the pharmaceutical industry. From production quality control to understanding surface interactions in biological systems, these analytical techniques are helpful at all steps in the life cycle of a pharmaceutical for creating more effective products and processes. X-ray Photoelectron Spectroscopy
(XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (
TOF-SIMS)are two of the most commonly used surface analysis methods for studying pharmaceutical samples. This application note discusses the complementary nature of XPS and TOF-SIMS for pharmaceutical materials.
