PHI nanoTOF II Time-of-Flight SIMS

PHI nanoTOF II Time-of-Flight SIMS

PHI’s patented TRIFT mass spectrometer with Parallel Imaging MS/MS provides superior sensitivity, low spectral background, unique ability to image highly topographic surfaces, high mass accuracy and mass resolution, and unambiguous high mass peaks identification with parallel tandem MS imaging capability. The PHI nanoTOF II can be configured with a wide variety of options to optimize performance for organic materials, inorganic materials, or both, depending on customer requirements. 

Tandem Mass Spectrometers For Rapid Imaging And Accurate Peak Identification

  • No data is ever discarded; integrated and uncomplicated TOF-SIMS (MS1) and tandem MS (MS2) imaging
  • Ultra-high transmission for optimized molecular sensitivity and monolayer analysis
  • High speed (> 8 kHz) TOF-SIMS (MS1) and tandem MS (MS2) imaging
  • High resolution (< 100 nm) TOF-SIMS (MS1) and tandem MS (MS2) imaging
  • High energy (> 1.5 keV) collision-induced dissociation (keV-CID) for identification

High-Throughput High Mass Resolution And High Lateral Resolution (HR2) Imaging

  • The most utilitarian analysis mode with < 500 nm chemical characterization
  • The HR2 imaging is attained at high analysis beam current so the analysis time is short
  • Delayed extraction (DE) is not necessary, so the artefacts of DE are completely avoided

Hands-Off, Turn-Key Charge Neutralization For Insulator Analysis

  • Self-regulating charge neutralization by low energy electrons and low energy inert gas ions
  • Artefact-free chemical imaging by neutralization of the position-dependent surface charges

Confident Chemical & Molecular Analysis Of Curved, Rough & Charging Samples

  • Superior angular acceptance and depth-of-field of the mass spectrometer
  • Artefact-free chemical imaging of ex situ and in situ FIB-sectioned samples
  • Superior imaging of materials by correcting the position-dependent surface potential
  • Delayed extraction (DE) is not necessary, so the artefacts of DE are completely avoided

Solutions For In Situ Characterization Of Advanced Materials

  • All operation modes available for automated and unattended analysis
  • Cryo- and high-temperature analysis via the Hot/Cold and High-Temperature module options; full 5-axis sample motion is maintained during temperature-controlled analysis
  • Advanced 3D imaging with use of optional Ar, O2, Cs, C60, Ar cluster, and Ga-FIB ion beams
  • Solid-state electrochemistry (biasing, polarization) experiments with the Static Voltage & Power Cycling option
  • Inert Sample Transfer Vessel and Transfer Vessel Adapter (25 mm AES/XPS puck) options
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Superior TRIFT Parallel Imaging MS/MS Analyzer Performance

Integrated Parallel Imaging MS/MS for fragmentation and analysis in a separate TOF analyzer providing unambiguous peak identification and parallel tandem MS imaging capability.

Uniform imaging sensitivity on curved or rough surfaces due to the large solid angle of collection

Superior depth-of-field for high mass resolution images due to large energy acceptance window

Low spectral background and highest abundance sensitivity due to the ability to reject metastable ions

High mass sensitivity for organic and medical applications

Turnkey insulator analysis enabled by patented dual beam charge compensation technology

MS/MS ready spectrometer for unambiguous peak identification

Parallel Imaging MS/MS

Due to the limitations of TOF-SIMS in mass accuracy and mass resolution, high mass peaks often go unidentified in traditional TOF-SIMS experiments.  PHI’s revolutionary Parallel Imaging MS/MS eliminates this limitation.  In the MS/MS mode, a precursor ion of choice (1 Dalton wide nanoisotopic acceptance window) is selected from the secondary ion stream and deflected into a high energy collision induced dissociation (CID) cell while the rest of the secondary ions are collected as usual (MS1 data).   In the CID cell, the precursor ions collide with argon gas causing fragmentation.  The resulting fragment ions are mass separated in a linear TOF and counted at a second pulse counting detector, producing an MS/MS spectrum (MS2).   Similar to the MS1 data, a full spectrum is collected for each image pixel in the MS/MS experiment.  Thus, the MS/MS tand traditional TOF-SIMS data are collected simultaneously from the same analytical area in a single experiment.  The imaging speed of both MS1 and MS2 data is based on a pulsed ion beam operated at >8 kHz.

The resulting MS/MS fragmentation spectrum is used to positively identify the composition of the precursor ion by identification of the fragmented ions and/or comparison to mass spectral databases.  Operating the TOF-SIMS in the MS/MS mode can also improve the sensitivity for species in which the peak of interest has mass interferences with other compounds.  By detection of a unique fragment ion originating from the species of interest, the limit of detection can be greatly improved.

Parallel imaging of MS1 and MS2 peaks from a sample of heat treated PET, showing that identical areas are analyzed at the two detectors and that the precursor molecule at +m/z 577 (ethylene terephthalate trimer) is localized to the crystals.   Line scans show <200 nm spatial resolution for both modes of imaging.  MS1 and MS2 data are collected in parallel at 8 kHz in less than 15 minutes.

Heat treated PET sample.  Composition assignments for the MS2 spec.  trum obtained from CID fragmentation of the +mass 577 precursor ion confirm that the observed crystals are composed of ethylene terephthalate trimer

Automotive polymer sample.   MS/MS image (MS2) of the +m/z 481 precursor ion showing a non-uniform distribution of the species on the sample surface.

MS/MS spectrum (MS2) obtained from CID fragmentation of the +m/z 481 precursor ion.  Identification of the fragment ions indicates that the precursor ion [M+H]+ is Tinuvin 770, a polymer additive.  

Further confirmation of the identity of the precursor ion is made with a positive match to Tinuvin 770 in a commercially available MS/MS database which is included with tandem MS/MS.  The spectrum in red is the MS2 spectrum and the blue spectrum is the acquired reference database spectrum of Tinuvin.

HR²

High spatial resolution with high mass resolution

HR² imaging is demonstrated below in the images of micro-organic droplets. In a single analysis, peaks for multiple molecular fragments were observed in the spectrum at m/z 57 with high mass resolution and identified by measurement of their exact mass. The distribution of each species was visualized with a spatial resolution of less than 400 nm. The single measurement that contains all this information was acquired in only six minutes due to the high ion beam current available in the PHI nanoTOF’s HR² imaging mode.

Cluster Source Ion Guns

Multiple cluster source ion gun options

20 kV Ar2500+ gas cluster ion beam for molecular depth profiling organic films. Shown in Fig. A is a depth profile of a multi-layer polystyrene and poly (2-vinylpyridine) block copolymer film obtained by sputtering with a 5 kV Ar2500+ gas cluster ion beam.

20 kV C60 ion gun provides imaging and spectroscopy when the highest sensitivity for organic species is required. Shown in Fig. B is the detection and imaging of specific lipids in a mouse brain specimen.

FIB-TOF 3D Chemical Imaging

  • TOF-SIMS imaging of FIB sectioned specimens
  • High mass resolution spectra at every pixel
  • 3D imaging software with multi-element overlay capability

3D FIB-TOF images of a solid oxide fuel cell with a 50 x 50 x 10 µm analysis volume show the ability to observe compositional information and physical structures such as voids.

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TOF-DR Software for TOF-SIMS Tandem MS Imaging Data Processing

TOF-DR 3.0 is the latest release of PHI’s software for the treatment, processing, presentation and reporting of TOF-SIMS tandem MS imaging data.

The new release includes new or improved capabilities for instant viewing of raw data, peak identification, graphical data presentation and report generation.

Features include:

  • Windows 10 64-bit compatibility
  • TOF-SIMS MS/MS spectra and 2D/3D image analysis
  • Spectral dead time correction
  • 2D/3D region-of-interest (ROI) analysis
  • Software-guided batch data processing with output to Excel® for plotting and graphical viewing of the raw and normalized data
  • Data Review Utility tool for instant and simultaneous observation of peaks, images and profiles with identification tools
  • Report Generation tool for easy layout and presentation of data with automated creation of PowerPoint® slides
  • PLS_Toolbox® compatibility for full uni- and multi-variate data analysis
  • NIST MS/MS® compatibility for tandem MS precursor identification

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Application Notes

Additive Identification Using MS/MS (NEW) PET Oligomer Identification With MS/MS (NEW) 3D Characterization Of A PS P2VP Block Copolymer 3D FIB TOF Imaging The Microstructure Of An Alloy 3D Imaging of a Pharmaceutical Coating Using TOF-SIMS TRIFT I-IV: Adjustable Height Sample Holder Advantages of the TRIFT Analyzer for Imaging and Spectroscopy in the PHI nanoTOF Chemical Imaging at the Interface of a Bulk Elastomer Laminate Chemical Imaging Of Particles With The Phi Nanotof Differentiation of Epicuticular Wax Components on the surface of Arabadopsis Organs by TOF-SIMS Imaging Imaging Additives On Human Hair With The PHI nanoTOF Identification of Eu Oxidation States in a Doped Phosphor by TOF-SIMS Imaging Imaging the Phase Segregation in PS/PMMA Copolymer Blends by TOF-SIMS Large Area (Mosaic) C_60^+^_ Imaging by TOF-SIMS Molecular Imaging of Micron-Scale Features with a C_60^+^_ Primary Ion Beam Mosaic Imaging Of Frozen Hydrated Lenses Optimizing C_60_ Incidence Angle for Polymer Depth Profiling by TOF-SIMS Quantitative Analysis of Topographic Effects on Conductive Surfaces in the PHI nanoTOF Relative Quantification of a Transition Metal Dopant in a Polycrystalline Matrix by TOF-SIMS Time Of Flight Secondary Ion Mass Spectrometry TOF SIMS Analysis Of Organic LED Films TOF SIMS Analysis Of The Glass Phase In AZS Material TOF-SIMS Chemical Imaging of Metal Interconnects on a Flexible Organic Substrate TOF SIMS Imaging Of A Drug Pellet TOF-SIMS Molecular Imaging of a Micro-patterned Biological Ligand TOF-SIMS Imaging of High Mass Oligomers Localized to Marine Aerosol Particle Surfaces TOF SIMS Of Multi Layer Paint Coatings Tuning The Matsuda Voltage Of The TRIFT Spectrometer Wincadence Compound Identification Tool Complementary XPS and TOF-SIMS for Organic Analysis XPS and TOF-SIMS for the Pharmaceutical Industry

Published Papers

Analytical Chemistry - 3D Imaging Pharmaceutical Drug Polymer Analytical Chemistry - New Method and Spectrometer for TOF-SIMS Parallel Imaging Tandem MS Analytical Chemistry - Sequencing and Identification of Neuropeptides by TOF-SIMS Tandem MS Applied Surface Science - TOF-SIMS XPS Nanoindentation of C60-Profiled PMMA BioInterphases - Characterization of Natural Photonic Crystals in Iridescent Damselfly Wings BioInterphases - Observation of ER Tubules by Tandem MS Imaging Imaging Mass Spectrometry: Methods and Protocols, Methods in Molecular Biology, Chapter 16 Cluster Secondary Ion Mass Spectrometry - Chapter 6 - 3D Imaging with Cluster Ion Beams Journal or Proteom - Protein Identification by LC-ME-SIMS Journal of Materials Chemistry - Visualizing Molecular Distributions in BioMaterials by MS Imaging - A Review Journal of Vacuum Science Technology - Accurate and Reproducible In-Depth Observation of Hybrid Materials by FIB-TOF Microscopy and Microanalysis - High Resolution Tandem MS Imaging of PET Surface Precipitates Nature Science Reports - 3D TOF-SIMS Imaging of Cellular Cleavage Bodies OpticsExpress - Identification of Eu Oxidation States in a Phosphor by TOF-SIMS The Royal Society of Chemistry: RSC Advances - Tribochemistry of Friction Modifiers in Bio Diesel Surface and Interface Analysis - FIB-TOF of Polymer with GCIB Journal of Vacuum Science and Technology - Parallel Imaging MS/MS Instrument Vacuum Technology & Coating - 3D FIB-TOF of Organics Vacuum Technology & Coating - Introduction of TOF-SIMS Parallel Imaging MS/MS at M&M Conference N‑Heterocyclic Linkages Are Produced from Condensation of Amidines onto Graphitic Carbon

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© 2021 Physical Electronics, Inc. (PHI) All Rights Reserved.
© 2021 Physical Electronics, Inc. (PHI) All Rights Reserved.