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Date: June 30, 2010
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Date: March 19, 2010
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Date: February 18, 2010
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Date: February 12, 2010
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Date: February 11, 2010Description: February 2010
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Date: December 7, 2009
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Date: December 1, 2009
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Date: August 19, 2009Description: New National Nano Surface Characterization Facility (NNSCF) in South Africa features PHI Instruments.
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Date: June 12, 2009
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Date: February 4, 2008
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Date: February 20, 2007Description: Installation of PHI 700 System in Lab for Space Sciences at Washington University in St. Louis.
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Date: November 12, 2006Description: At the 53rd meeting of the American Vacuum Society, Physical Electronics will introduce a new XPS instrument, the VersaProbe.
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Date: November 12, 2006Description: At the 53rd meeting of the American Vacuum Society, Physical Electronics will introduce its new nanoTOF Time-of Flight Secondary Ion Mass Spectrometer.
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