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  • PHI 700 Auger Nanoprobe
    • Overview
    • Product Brochure
    • Die Navigation Module
    • Related Techniques
      • AES
    • Application Notes
      • Characterizing Electrically Isolated Bond Pad Surfaces
      • Characterizing Nano-Scale Precipitates in Steel
      • High Spatial Resolution Auger Imaging
      • High Spatial Resolution Auger Imaging of Highly Topographic Samples
      • Fracture Analysis of an Embrittled Low Alloy Steel Rotor Blade from an Operating Steam Turbine
      • Auger Analysis of Boron Oxide Crystals Formed by CBN Chemical Vapor Deposition (CVD)
      • Using Low Energy Ions for Charge Neutralization in Scanning Auger Nanoprobes
      • Optimized Depth Resolution with Low Voltage Sputtering and Zalar Rotation
      • TiN Composition Measurements by Auger Electron Spectroscopy
      • Compucentric Zalar Profile of a 10 μm Al Pad Using the PHI 680 Scanning Auger Nanoprobe
      • Defect Navigation on Wafer Pieces with the PHI 700 Auger Nanoprobe
  • PHI Quantera XPS Microprobe
    • Overview
    • Product Brochure
    • Related Techniques
      • XPS
    • Application Notes
      • Identifying Organic Defects
      • Identifying Stains on Packaging Materials
      • Determining Solder Ball Surface Chemistry
      • Characterizing Bumped Wafers
      • Full Wafer Surface Composition Maps
      • Hard Disk Surface Composition Maps
      • Automated QC Analysis: Silicone Detection
      • PHI Model 06-C60 C60 Sputter Ion Gun Package
      • Cleaning Polymer Surfaces with the PHI 06-C60 Sputter Ion Gun
      • Mapping Motor Oil Additives on a Cam Shaft Lobe
      • Micro-XPS of Contamination on Read/Write Heads
      • Characterizing a Block Copolymer Surface
      • Thin Film Analysis of Polymer Additive Migration Using the PHI Model 06-C60 Sputter Ion Gun
      • Depth Profiling Organic Films with the PHI 06 C60 Sputter Ion Gun
  • PHI VersaProbe XPS Microprobe
    • Overview
    • Product Brochure
    • Related Techniques
      • XPS
    • Application Notes
      • Identifying Organic Defects
      • Identifying Stains on Packaging Materials
      • Determining Solder Ball Surface Chemistry
      • Characterizing Bumped Wafers
      • Full Wafer Surface Composition Maps
      • Hard Disk Surface Composition Maps
      • Automated QC Analysis: Silicone Detection
      • PHI Model 06-C60 C60 Sputter Ion Gun Package
      • Cleaning Polymer Surfaces with the PHI 06-C60 Sputter Ion Gun
      • Mapping Motor Oil Additives on a Cam Shaft Lobe
      • Micro-XPS of Contamination on Read/Write Heads
      • Characterizing a Block Copolymer Surface
      • Thin Film Analysis of Polymer Additive Migration Using the PHI Model 06-C60 Sputter Ion Gun
      • Molecular Imaging of Micron Scale Features
      • Depth Profiling Organic Films with the PHI 06-C60 Sputter Ion Gun
  • PHI nanoTOF TOF-SIMS
    • Overview
    • Product Brochure
    • Related Techniques
      • TOF-SIMS
    • Application Notes
      • 3D Imaging of a CMOS Device
      • Accurate Determination of Elemental Contamination on Wafer Surfaces
      • Analysis of Alq3 OLED Materials
      • Monitoring Elemental Contaminants on Semiconductor Product Wafers
      • PHI WinCadence Compound Identification Tool
      • Radial Distribution of Copper Contamination on the Surface of a Polished Silicon Wafer
      • SIMS Enhancement of Molecular Ion Yields Using a Gold LMIG
      • Surface Metal Contmination on Patterned Wafers
      • Time of Flight Secondary Ion Mass Spectrometry
      • TOF SIMS Analysis of a Drug Pellet Cross Section
      • TOF SIMS Analysis of a Hard Disk
      • TOF SIMS Analysis of a Pesticide Treated Leaf
      • TOF SIMS Analysis of a Pole Tip Gap
      • TOF SIMS Analysis of PDMS
      • TOF SIMS Analysis of Polystyrene Oligomer Distributions
      • TOF SIMS Analysis of Semiconductor Device Vias
      • TOF SIMS Characterization of Multi-Layer Paint Coatings
      • TOF SIMS Detection of High Mass Oligomers
      • TOF SIMS High Mass Resolution
      • TOF SIMS Imaging of a Paint Cross Section
      • TOF SIMS Imaging of Insulating Organic Samples with High Top
      • TOF SIMS Imaging of Molybdenum Oxide Powders
      • TOF SIMS Imaging of Rough Surfaces
      • TOF-SIMS Analysis of the Glass Phase in AZS Materials
      • TOF-SIMS Molecular Imaging of a Micropatterned Biological Ligand
      • Molecular Imaging of Micron Scale Features
      • Large Area (Mosaic) C60+ Imaging by TOF-SIMS
      • Chemical Imaging at the Interface of a Bulk Elastomer Laminate
      • 3D Imaging of a Pharmaceutical Coating Using TOF-SIMS
      • Adjustable Height Sample Holder
  • PHI ADEPT-1010 D-SIMS
    • Overview
    • Product Brochure
    • Related Techniques
      • D-SIMS
    • Application Notes
      • Detection Limits for Atmospheric Contaminants
      • ADEPT-1010: Long Term Measurement Stability
  • Used PHI Equipment
    • Overview
    • PHI 670 Scanning Auger Nanoprobe
    • PHI SMART-200
    • PHI 690 Scanning Auger Nanoprobe
    • PHI TRIFT III
    • Used Components
• Techniques
  • AES
    • Related Products
      • PHI 700 Auger Nanoprobe™
  • XPS / ESCA
    • Related Products
      • PHI Quantera XPS Microprobe
      • PHI VersaProbe XPS Microprobe
  • TOF-SIMS
    • Related Products
      • PHI nanoTOF TOF-SIMS
  • D-SIMS
    • Related Products
      • PHI ADEPT-1010 D-SIMS
• Applications
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  • Magnetic Media
  • Materials Research
  • Polymers
  • Thin Films and Coatings
  • Biomedical
  • Pharmaceutical
• About Us
  • About PHI
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    • Auger Analysis of Stardust at Washington University
  • Events
    • University of Illinois Workshop: New Developments and Applications of TOF-SIMS, SAM, and XPS for Surface and Thin Film Analysis
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