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PHI 700Xi Scanning Auger Nanoprobe
- Overview
- Product Brochure
- Die Navigation Module
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Application Notes
- Characterizing Electrically Isolated Bond Pad Surfaces
- Characterizing Nano-Scale Precipitates in Steel
- High Spatial Resolution Auger Imaging
- High Spatial Resolution Auger Imaging of Highly Topographic Samples
- Fracture Analysis of an Embrittled Low Alloy Steel Rotor Blade from an Operating Steam Turbine
- Auger Analysis of Boron Oxide Crystals Formed by CBN Chemical Vapor Deposition (CVD)
- Using Low Energy Ions for Charge Neutralization in Scanning Auger Nanoprobes
- Optimized Depth Resolution with Low Voltage Sputtering and Zalar Rotation
- TiN Composition Measurements by Auger Electron Spectroscopy
- Compucentric Zalar Profile of a 10 μm Al Pad Using the PHI 680 Scanning Auger Nanoprobe
- Application for EBSD Option
- Defect Navigation on Wafer Pieces with the PHI 700 Auger Nanoprobe
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PHI Quantera II Scanning XPS Microprobe
- Overview
- Product Brochure
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Application Notes
- Identifying Organic Defects
- Identifying Stains on Packaging Materials
- Determining Solder Ball Surface Chemistry
- Characterizing Bumped Wafers
- Full Wafer Surface Composition Maps
- Hard Disk Surface Composition Maps
- Automated QC Analysis: Silicone Detection
- PHI Model 06-C60 C60 Sputter Ion Gun Package
- Cleaning Polymer Surfaces with the PHI 06-C60 Sputter Ion Gun
- Mapping Motor Oil Additives on a Cam Shaft Lobe
- Micro-XPS of Contamination on Read/Write Heads
- Characterizing a Block Copolymer Surface
- Thin Film Analysis of Polymer Additive Migration Using the PHI Model 06-C60 Sputter Ion Gun
- Depth Profiling Organic Films with the PHI 06 C60 Sputter Ion Gun
- Micro Area XPS Depth Profiling
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PHI VersaProbe II Scanning XPS Microprobe
- Overview
- Product Brochure
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Application Notes
- Identifying Organic Defects
- Identifying Stains on Packaging Materials
- Determining Solder Ball Surface Chemistry
- PHI Model 06-C60 C60 Sputter Ion Gun Package
- Cleaning Polymer Surfaces with the PHI 06-C60 Sputter Ion Gun
- Micro-XPS of Contamination on Read/Write Heads
- Characterizing a Block Copolymer Surface
- Thin Film Analysis of Polymer Additive Migration Using the PHI Model 06-C60 Sputter Ion Gun
- Depth Profiling Organic Films with the PHI 06-C60 Sputter Ion Gun
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PHI nanoTOF TOF-SIMS
- Overview
- Product Brochure
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Application Notes
- Differentiation-of-the-Epicuticular-Waxes-on-the-Surface-of-Arabidopsis-Organs
- 3D FIB-TOF Imaging the Microstructure of an Alloy
- Optimizing-C60-Incidence-Angle-for-Polymer-Depth-Profiling-by-TOF-SIMS
- Imaging Additives on Human Hair with the PHI nanoTOF
- Chemical Imaging of Particles with the PHI nanoTOF
- Large Area (Mosaic) C60+ Imaging by TOF-SIMS
- 3D Imaging of a CMOS Device
- 3D Imaging of a Pharmaceutical Coating Using TOF-SIMS
- Chemical Imaging at the Interface of a Bulk Elastomer Laminate
- TOF-SIMS Molecular Imaging of a Micropatterned Biological Ligand
- Adjustable Height Sample Holder
- SIMS Enhancement of Molecular Ion Yields Using a Gold LMIG
- Analysis of Alq3 OLED Materials
- Accurate Determination of Elemental Contamination on Wafer Surfaces
- Monitoring Elemental Contaminants on Semiconductor Product Wafers
- PHI WinCadence Compound Identification Tool
- Radial Distribution of Copper Contamination on the Surface of a Polished Silicon Wafer
- Surface Metal Contamination on Patterned Wafers
- Time of Flight Secondary Ion Mass Spectrometry
- TOF SIMS Analysis of a Drug Pellet Cross Section
- TOF SIMS Analysis of a Hard Disk
- TOF SIMS Analysis of a Pesticide Treated Leaf
- TOF SIMS Analysis of a Pole Tip Gap
- TOF SIMS Analysis of PDMS
- TOF SIMS Analysis of Polystyrene Oligomer Distributions
- TOF SIMS Analysis of Semiconductor Device Vias
- TOF SIMS Characterization of Multi-Layer Paint Coatings
- TOF SIMS Detection of High Mass Oligomers
- TOF SIMS High Mass Resolution
- TOF SIMS Imaging of a Paint Cross Section
- TOF SIMS Imaging of Insulating Organic Samples with High Top
- TOF SIMS Imaging of Molybdenum Oxide Powders
- TOF SIMS Imaging of Rough Surfaces
- TOF-SIMS Analysis of the Glass Phase in AZS Materials
- Molecular Imaging of Micron Scale Features
- Refurbished Equipment
- Product Upgrades
- XPS and AES Handbooks
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PHI 700Xi Scanning Auger Nanoprobe
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