Surface Analysis Products
For 40 years PHI surface analysis instruments have provided our customers with cutting edge technologies to solve their materials problems. Our complete product line enables detailed surface chemical characterization, nano-scale feature analysis, and thin film characterization. PHI can provide you with the surface analysis equipment that best meets your needs.
PHI 700Xi Scanning Auger Nanoprobe
Technology: AES
High performance Scanning Auger Nanoprobe with less than 8 nm Auger spatial resolution is based on PHI’s unique CMA design that provides superior imaging of samples with topography, such as nanostructures, and high energy resolution spectroscopy. Proven charge neutralization technology extends the application of AES to many non-conductive materials.
PHI Quantera II Scanning XPS Microprobe
Technology: XPS
High performance scanning XPS microprobe with 7.5 µm spatial resolution provides high sensitivity large and micro-area spectroscopy, inorganic and organic sputter depth profiling, and the highest productivity XPS platform available.
PHI VersaProbe II Scanning XPS Microprobe
Technology: XPS
PHI’s patented scanning XPS microprobe technology is now available on a versatile multi-technique surface analysis platform. Optional accessories include: UPS, dual anode x-ray source, AES, 10 or 20 kV C60+ion guns, 20 kV Ar2500+ gas cluster ion gun, and hot/cold sample stage.
PHI nanoTOF TOF-SIMS
Technology: TOF-SIMS
PHI’s patented TRIFT analyzer design provides superior performance for sub-micron elemental, chemical and molecular imaging and spectroscopy of surfaces and thin films via TOF-SIMS.
Used PHI Equipment
Technology: Various
Used PHI surface analysis instruments are refurbished to restore original performance and sold with a standard one year factory warranty. Follow the link below to view a list of currently available used equipment.
