Surface Analysis Instruments and Equipment | Physical Electronics, Inc. (PHI)

Expanding Surface Analysis Through Innovation

24th Annual Workshop on Secondary Ion Mass SpectrometryMay 14-18, 2012Doubletree Philadelphia Center City

E-MRS 2012 SPRING MEETINGMay 14-18, 2012Congress Center - Strasbourg, France

ASMS CONFERENCE ON MASS SPECTROMETRYMay 20-14, 2012Vancouver Cenvention Centre - Vancouver, BC, Canada

Surface Analysis Products

Surface AnalysisTechniques

Applications of Surface Analysis Equipment

Upcoming Events View All

05.14.2012 to

05.18.2012

2012 E-MRS Spring Meeting

05.14.2012 to

05.18.2012

24th Annual Workshop on Secondary Ion Mass Spectrometry

05.20.2012 to

05.24.2012

ASMS Conference on Mass Spectrometry

05.20.2012 to

05.25.2012

ELSPEC 2012

Recent NewsView All

04.04.2011

Update on ULVAC-PHI in Chigaski, Japan

03.03.2011

MultiPak Version 9

02.22.2011

PHI Presentation and Workshop at Drexel University

11.29.2010

PHI Receives Product Award for the Gas Cluster Ion Beam (GCIB) source!