News & Articles
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June 6, 2024
Multi-Technique Characterization of PtNi Nanowires for Enhanced Durability and Efficiency
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May 13, 2024
XPS Insights into Chemical Degradation Mitigation of Protective Coatings on NCM Cathodes
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May 6, 2024
Exploring the Power of TOF-SIMS by Coupling Collision-Induced Dissociation with Surface-Induced Dissociation for Structural Analysis
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February 21, 2024
XPS Insights of Fluorinated Ether Electrolyte for High Voltage Li Metal Batteries
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February 7, 2024
Surface Analysis Spotlight Part 4: Concluding Perspectives on Advanced Thin Film Characterization via StrataPHI 2.0 Software
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December 12, 2023
Surface Science Discoveries: Using TOF-SIMS in Quantum Computing & Battery Innovation
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December 4, 2023
Surface Analysis Spotlight Part 3: What Range of Film Thickness Can StrataPHI Calculate from Angle-Resolved XPS and HAXPES Spectra?
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© 2024 Physical Electronics, Inc. (PHI)
All Rights Reserved.