Contract Lab

Physical Electronics (PHI), the premier name in surface analysis instrumentation, is pleased to once again be offering contract analytical services.  Our state-of-the-art Auger, XPS and TOF-SIMS instruments, in coordination with our scientists’ deep knowledge of surface analysis applications and problem solving, is a winning combination to help you tackle your most challenging production, R&D, reverse engineering, and failure analysis issues.

To discuss a particular project or to request a quotation, please contact John Newman at analysis@phi.com or 952-828-6409

The techniques and options available in our Chanhassen MN lab include:

AES - Auger Electron Microscopy

  • 710 Field Emission Auger Analysis with <8 nm Auger spatial resolution
  • Argon ion depth profiling
  • In-situ fracture

XPS - X-Ray Electron Microscopy

  • Also known as ESCA - Electron Spectroscopy for Chemical Analysis
  • Quantera or VersaProbe III XPS Analysis with <10   m spatial resolution
  • Argon ion depth profiling
  • Also available on a limited basis: C60 cluster beam depth profiling and Argon Gas Cluster Ion Beam (GCIB) depth profiling

TOF-SIMS - Time-of-Flight Photoelectron Spectroscopy 

  • nanoTOF II TOF-SIMS Analysis with <70 nm spatial resolution
  • Argon ion depth profiling
  • Oxygen ion depth profiling
  • Argon Gas Cluster Ion Beam (GCIB) depth profiling
  • Also available on a limited basis: Focused Ion Beam (FIB) cross-sectioning, Tandem Mass Spectroscopy (MS/MS), and Hot/Cold stage

All techniques also offer the option of inert gas transfer of samples from a dry glove box to the instruments without exposure to air. 

To discuss a particular project or to request a quotation, please contact John Newman at analysis@phi.com or 952-828-6409