Contract Analytical Services

Physical Electronics (PHI), the premier name in surface analysis offers analytical services using our state-of-the-art instruments. Our scientists have a deep knowledge of surface analysis applications and problem solving, and the benefit of always having access to the latest instrument technology. It is a winning combination to help you tackle your most challenging production, R&D, and engineering issues.

To discuss a particular project or to request a quotation, please contact PHI at analysis@phi.com or 952-828-6100

Common Applications

  • Coatings
  • Nanomaterials and Thin Films
  • Material Failure and Process Control
  • Surface Defects and Contamination
  • Competitive Analysis
  • Biomaterials and Pharmaceuticals
  • Materials Engineering

XPS - X-Ray Photoelectron Spectroscopy

  • PHI Quantera an VersaProbe III scanning XPS microprobe systems with spectroscopic spatial resolution <10um
  • Quantification and chemical state analysis
  • Argon ion sputter depth profiling
  • Also available: C60 ion and argon gas cluster ion (GCIB) sputter depth profiling

AES - Auger Electron Spectroscopy

  • PHI 710 field emission auger system with analytical spatial resolution < 8 nm 
  • Surface sensitive compositional analysis
  • Ion sputter depth profiling
  • In-situ fracture

TOF-SIMS - Time-of-Flight Secondary Ion Mass Spectrometry

  • PHI nanoTOF II TOF-SIMS Analysis with <70 nm spatial resolution 
  • Molecular imaging and trace analysis
  • Argon ion and oxygen depth profiling
  • Argon Gas Cluster Ion Beam (GCIB) depth profiling
  • Also available: Focused Ion Beam (FIB) cross-sectioning, tandem mass spectroscopy (MS/MS), and sample heating and cooling

All techniques also offer the option of inert gas transfer of samples from a dry glove box to the instruments without exposure to air. 

To discuss a particular project or to request a quotation, please contact PHI at analysis@phi.com or 952-828-6100