Contract Analysis Lab

Physical Electronics (PHI), the premier name in surface analysis offers analytical services using our state-of-the-art instruments. Our scientists have a deep knowledge of surface analysis applications and problem solving, and the benefit of always having access to the latest instrument technology. It is a winning combination to help you tackle your most challenging production, R&D, and engineering issues.

To discuss a particular project or to request a quotation, please contact John Newman at analysis@phi.com or 952-828-6409

The techniques and options available in our Chanhassen MN lab include:

AES - Auger Electron Spectroscopy

  • PHI 710 Field emission Auger analysis with <8 nm auger spatial resolution
  • Surface sensitive compositional analysis
  • Ion sputter depth profiling
  • In-situ fracture

XPS - X-Ray Photoelectron Spectroscopy

  • Also known as ESCA - Electron Spectroscopy for Chemical Analysis
  • PHI Quantera and VersaProbe III XPS Analysis with <10 µm spatial resolution
  • Quantification and chemical state analysis
  • Argon ion sputter depth profiling
  • Also available on a limited basis: C60 ion & argon gas cluster ion beam (GCIB) sputter depth profiling

TOF-SIMS - Time-of-Flight Secondary Ion Mass Spectroscopy 

  • PHI nanoTOF II TOF-SIMS Analysis with <70 nm spatial resolution
  • Molecular imaging and trace analysis
  • Argon ion depth profiling
  • Oxygen ion depth profiling
  • Argon Gas Cluster Ion Beam (GCIB) depth profiling
  • Also available on a limited basis: Focused Ion Beam (FIB) cross-sectioning, tandem mass spectroscopy (MS/MS), and hot/cold stage

All techniques also offer the option of inert gas transfer of samples from a dry glove box to the instruments without exposure to air. 

To discuss a particular project or to request a quotation, please contact John Newman at analysis@phi.com or 952-828-6409