News & Articles

November 12, 2020

New Application Note - Elemental Nano-Volume Characterization of ALD Defect Particles

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October 14, 2020

Congratulations Kateryna Artyushkova on receiving the AVS Fellow Award

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September 2, 2020

New Application Note - Using AES, EDS, and FIB to Detect, Identify, and Image Buried Metallic Particles

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August 24, 2020

New Application Note - Complementary XPS and TOF-SIMS for Organic Analysis

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July 17, 2020

New Application Note - Corrosion Analysis in Metallurgical Samples: A PHI 710 Multi-technique Approach

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June 19, 2020

Announcing PHI’s new in situ Dual Gas Cluster Ion Beam (GCIB) and monatomic ion source ​for Quantes XPS instruments

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March 25, 2020

PHI's update on COVID-19 pandemic

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March 12, 2020

2020 PHI Software & Data Reduction Training and European User Meeting Postponed

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September 20, 2019

Physical Electronics User Meeting Recap

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© 2022 Physical Electronics, Inc. (PHI) All Rights Reserved.