Contract Analytical Services

Physical Electronics (PHI), the premier name in surface analysis offers analytical services using our state-of-the-art instruments. Our scientists have a deep knowledge of surface analysis applications and problem solving, and the benefit of always having access to the latest instrument technology. It is a winning combination to help you tackle your most challenging production, R&D, and engineering issues.

To discuss a particular project or to request a quotation, please contact PHI at analysis@phi.com or 952-828-6100

Common Applications

• Coatings
• Nanomaterials and Thin Films
• Material Failure and Process Control
• Surface Defects and Contamination
• Competitive Analysis
• Biomaterials and Pharmaceuticals
• Materials Engineering

XPS - X-Ray Photoelectron Spectroscopy

• PHI Quantera an VersaProbe III scanning XPS microprobe systems with spectroscopic spatial resolution <10um
• Quantification and chemical state analysis
• Argon ion sputter depth profiling
• Also available: C60 ion and argon gas cluster ion (GCIB) sputter depth profiling

AES - Auger Electron Spectroscopy

• PHI 710 field emission auger system with analytical spatial resolution < 8 nm 
• Surface sensitive compositional analysis
• Ion sputter depth profiling
• In-situ fracture

TOF-SIMS - Time-of-Flight Secondary Ion Mass Spectrometry

• PHI nanoTOF II TOF-SIMS Analysis with <70 nm spatial resolution 
• Molecular imaging and trace analysis
• Argon ion and oxygen depth profiling
• Argon Gas Cluster Ion Beam (GCIB) depth profiling
• Also available: Focused Ion Beam (FIB) cross-sectioning, tandem mass spectroscopy (MS/MS), and sample heating and cooling

All techniques also offer the option of inert gas transfer of samples from a dry glove box to the instruments without exposure to air. 

To discuss a particular project or to request a quotation, please contact PHI at analysis@phi.com or 952-828-6100