Contract Analytical Services
Physical Electronics (PHI), the premier name in surface analysis offers analytical services using our state-of-the-art instruments. Our scientists have a deep knowledge of surface analysis applications and problem solving, and the benefit of always having access to the latest instrument technology. It is a winning combination to help you tackle your most challenging production, R&D, and engineering issues.
To discuss a particular project or to request a quotation, please contact PHI at analysis@phi.com or 952-828-6100
Common Applications
- Coatings
- Nanomaterials and Thin Films
- Material Failure and Process Control
- Surface Defects and Contamination
- Competitive Analysis
- Biomaterials and Pharmaceuticals
- Materials Engineering
XPS - X-Ray Photoelectron Spectroscopy
- PHI Quantera and VersaProbe III scanning XPS microprobe systems with spectroscopic spatial resolution <10um
- Quantification and chemical state analysis
- Argon ion sputter depth profiling
- Also available: C60 ion and argon gas cluster ion (GCIB) sputter depth profiling
AES - Auger Electron Spectroscopy
- PHI 710 field emission Auger system with analytical spatial resolution < 8 nm
- Surface sensitive compositional analysis
- Ion sputter depth profiling
- In-situ sample fracturing
- In-situ cryogenic sample fracturing
- Focused Ion Beam (FIB)
- Energy Dispersive X-ray Spectroscopy (EDS)
TOF-SIMS - Time-of-Flight Secondary Ion Mass Spectrometry
- PHI nanoTOF II TOF-SIMS Analysis with <70 nm spatial resolution
- Molecular imaging and trace analysis
- Argon ion and oxygen depth profiling
- Argon Gas Cluster Ion Beam (GCIB) depth profiling
- Also available: Focused Ion Beam (FIB) cross-sectioning, tandem mass spectrometry (MS/MS), and sample heating and cooling
All techniques also offer the option of inert gas transfer of samples from a dry glove box to the instruments without exposure to air.
To discuss a particular project or to request a quotation, please contact PHI at analysis@phi.com or 952-828-6100
"PHI was an extremely valuable resource for our investigations into a major issue in some of our products. PHI's TOF-SIMS studies helped us nail down exactly which film was compromised. Armed with that information, we managed to successfully address the problem, and PHI was a significant contributor to that success."
- Semiconductor Contract Customer -