News & Articles

February 21, 2024

XPS Insights of Fluorinated Ether Electrolyte for High Voltage Li Metal Batteries

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February 7, 2024

Surface Analysis Spotlight Part 4: Concluding Perspectives on Advanced Thin Film Characterization via StrataPHI 2.0 Software

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January 24, 2024

Impact of PHI XPS instruments on scientific discovery

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January 22, 2024

Impact of PHI TOF-SIMS instruments on scientific discovery

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December 12, 2023

Surface Science Discoveries: Using TOF-SIMS in Quantum Computing & Battery Innovation

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December 4, 2023

Surface Analysis Spotlight Part 3: What Range of Film Thickness Can StrataPHI Calculate from Angle-Resolved XPS and HAXPES Spectra?

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November 10, 2023

XPS Chemical State Analysis of N-Doped Carbon Surface Coatings for Improved Battery Stability

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October 25, 2023

Surface Analysis Spotlight Part 2: The StrataPHI Approach to Reconstructing the Depth Distribution of Multi-Layered Thin Films Non-Destructively

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October 6, 2023

Ensuring successful experiments when moving beyond XPS: a comparison of the experimental requirements for LEIPS, UPS, and REELS

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© 2024 Physical Electronics, Inc. (PHI) All Rights Reserved.