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XPS/HAXPES Scanning Microprobe

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PHI VersaProbe III

A multi-technique XPS instrument optimized for flexibility

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com.plaudit.core.content.impl.content.ElementInstanceImpl@42c9e7f2

PHI nanoTOF II

A TOF-SIMS instrument optimized for the highest sensitivity elemental and molecular analysis

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com.plaudit.core.content.impl.content.ElementInstanceImpl@2b29a37

PHI Quantera II

A dedicated XPS instrument optimized for throughput

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com.plaudit.core.content.impl.content.ElementInstanceImpl@62e220d6

PHI 710

A scanning Auger instrument optimized for high magnification chemical imaging

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com.plaudit.core.content.impl.content.ElementInstanceImpl@5d8ed705

PHI X-tool

A dedicated XPS instrument optimized for ease-of-use

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com.plaudit.core.content.impl.content.ElementInstanceImpl@4f85747b

Refurbished

These instruments have been fully refurbished at PHI and performance has been brought up to the original specifications.

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System Upgrades

A list of field upgrades currently available for your system.

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System Software

A list of software currently available for your system.

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© 2020 Physical Electronics, Inc. (PHI) All Rights Reserved.