Fully automated multi-technique scanning XPS/HAXPES microprobe
Automated high-throughput XPS/HAXPES Scanning Microprobe
A multi-technique XPS instrument optimized for flexibility
A TOF-SIMS instrument optimized for the highest sensitivity elemental and molecular analysis
A dedicated XPS instrument optimized for throughput
A scanning Auger instrument optimized for high magnification chemical imaging
These instruments have been fully refurbished at PHI and performance has been brought up to the original specifications.
A list of field upgrades currently available for your system.
A list of software currently available for your system.
