Driving Discoveries Through Surface Analysis Thin Film Composition
Driving Discoveries Through Surface Analysis Chemical Imaging
Driving Discoveries Through Surface Analysis Defect Analysis
Driving Discoveries Through Surface Analysis New Materials Development
Driving Discoveries Through Surface Analysis Surface Contamination
Driving Discoveries Through Surface Analysis Additive Manufacturing
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Recent News & Articles

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May 13, 2025

Structural Assessment of (Sub-)Monolayer Coatings in Device Processing at High Spatial Resolving Power by TOF-SIMS Tandem MS Imaging

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March 14, 2025

Impact of PHI TOF-SIMS instruments on scientific discovery

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February 20, 2025

Impact of PHI XPS instruments on scientific discovery

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5/21/2025

67th Annual Conference Microscopy Society of NE Ohio

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5/22/2025

AVS Mid-Atlantic Chapter DC Regional Meeting (NIST)

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6/3/2025 - 6/4/2025

Advanced Materials Characterization 2025

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What Our Customers Say

“The PHI Genesis X-ray Photoelectron Spectroscopy (XPS) instrument has revolutionized our lab's capabilities. Its advanced features and flexibility enable detailed surface material analysis, while PHI's exceptional support ensures smooth operations. The seamless installation and insightful training provided by PHI's knowledgeable field engineers have made this system an invaluable addition to our facilities.”

Quantum Valley Ideas Lab

“PHI's service team is exceptional. Their engineers are professional, reliable, and knowledgeable, always seeking help when needed to ensure reliability. The scientists are equally impressive, providing clear guidance for analysis. PHI's customer service is amazing.”

NY CREATES

“As a global supplier in the automotive, aerospace, and industrial markets, we rely on PHI Auger instruments for customer support, production, and R&D. The PHI 710 Auger, with its state-of-the-art capabilities and excellent customer support, continues to drive our product and process development. The expertise of PHI's service engineers and scientists, along with the flexibility to add specific capabilities, strengthens our long-standing relationship with PHI.”

Manufacturing Customer

“PHI's prompt and willing responses to our VersaProbe system and data analysis concerns have been invaluable. Their excellent application support ensures we always have the help we need.”

University of Virginia

“PHI's TOF-SIMS studies were instrumental in resolving a major issue in our products. Their expertise helped us identify the compromised film, enabling us to successfully address the problem. PHI's support was a significant contributor to our success.”

Semiconductor Contract Customer

“We are very pleased with the timely assistance our users have received from PHI's application department over the past six years. The experienced application scientists provide invaluable tips and share application materials promptly, often on the same day. PHI's support has been crucial in expanding our user base and exploring new applications on the system.”

Seagate
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