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New Ion Gun for Quantes

Announcing PHI’s new in situ Dual Gas Cluster Ion Beam (GCIB) and monatomic ion source ​for Quantes XPS instruments.  

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September 02, 2020
Using AES, EDS, and FIB to Detect, Identify, and I
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August 24, 2020
Complementary XPS and TOF-SIMS for Organic Analysi
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July 17, 2020
Corrosion Analysis in Metallurgical Samples: A PHI
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© 2020 Physical Electronics, Inc. (PHI) All Rights Reserved.