Surface Analysis Solutions for Chemical Imaging Learn More
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Contract Lab Analysis Contract Lab Analysis Available Learn More
Surface Analysis Solutions for New Materials Development Learn More
Surface Analysis Solutions for Surface Contamination Learn More
Surface Analysis Solutions for Thin Film Composition Learn More
StrataPHI - Software for estimating thicknesses from spectral and angle-dependent XPS Learn More

Webinar announcement

Auger Electron Spectroscopy - Fundamentals and Applications.  Registration coming soon.

New Ion Gun for Quantes

Announcing PHI’s new in situ Dual Gas Cluster Ion Beam (GCIB) and monatomic ion source ​for Quantes XPS instruments.  

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© 2020 Physical Electronics, Inc. (PHI) All Rights Reserved.