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New Ion Gun for Quantes

Announcing PHI’s new in situ Dual Gas Cluster Ion Beam (GCIB) and monatomic ion source ​for Quantes XPS instruments.  

Events

October 27 - 29, 2020
AVS 67 Virtual Showcase
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January 21
Introduction to TOF-SIMS Depth Profiling Webinar
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News

September 02, 2020
New Application Note - Using AES, EDS, and FIB to Detect, Identify…
Using AES, EDS, and FIB to Detect, Identify, and I
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August 24, 2020
New Application Note - Complementary XPS and TOF-SIMS for Organic…
Complementary XPS and TOF-SIMS for Organic Analysi
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July 17, 2020
New Application Note - Corrosion Analysis in Metallurgical Samples:…
Corrosion Analysis in Metallurgical Samples: A PHI
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© 2020 Physical Electronics, Inc. (PHI) All Rights Reserved.