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News & Articles

October 15, 2026

Advancing TOF-SIMS Workflows for Automated Mineral Grain Identification in Complex Samples

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October 6, 2026

Advancing XPS Workflows Through Data-Driven Automation

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September 22, 2026

Analysis of Interfaces by Soft and Hard X-ray Photoemission

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August 31, 2026

Nondestructive Analysis of Al2O3/SiOx/Si Passivation Layers for Photovoltaics Using Angle-Resolved HAXPES Techniques

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August 12, 2026

Unlocking Nanoscale Insights with Auger Electron Spectroscopy

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August 3, 2026

Revealing ALD Film Growth with Angle-Dependent XPS

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July 27, 2026

XPS Reveals the Active Surface Chemistry Behind a High-Performance Polymer for Water Purification

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June 12, 2026

Chemical Imaging of Cathode−Electrolyte Interphase (CEI) in Sulfide Solid-State Batteries

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June 3, 2026

Compositional characterization of electrically isolated solder bumps by Scanning Auger Electron Spectroscopy (AES)

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