Event
56th AVS International Symposium & Exhibition
Physical Electronics continues to be a proud sponsor of AVS and is supporting the 56 th International Symposium and Exhibition this year as a Platinum level sponsor. Members of our technical and sales staff will be present at our booths in the exhibition hall and participating in the technical sessions.
In the Exhibitor Workshop sessions on Tuesday, November 10 at 1:00 PM, Dr. John Hammond will present State-of-the-Art Nanostructure Compositional Analysis with Scanning Auger Microscopy . On Thursday, November 12, four PHI talks will be presented. At 9:40 AM, Advances in 2D and 3D TOF-SIMS Imaging of Organics by Means of a C 60 Ion Microprobe and FIB Sectioning will be presented by Dr. Greg Fisher. At 2:20 PM, Dr. Sankar Raman will present Nanocone Chemical Analysis with High Resolution Scanning Auger Microscopy. At 4:40 PM, Dr. Scott Bryan will present Optimization of C 60 Sputtering Conditions for Polymer Depth Profiling by TOF-SIMS and at 5:00 PM, Dr. John Hammond will present Metrics for Polymer Depth Profiling with C 60 Ion Sources . Both Dr. Bryan’s and Dr. Hammond’s talks are part of the Chemical State Depth Profiling Session which will be chaired by Dr. Fisher. We hope you will have the opportunity to attend these presentations to learn about some of the latest developments at PHI.
In our booths we will be announcing our newest Scanning Auger Nanoprobe, the PHI 700Xi.Please stop by booths 528 & 529 to learn about this exciting new instrument. Our technical staff will be available to show you the newest features in PHI MultiPak and to demonstrate the VersaProbe Multi-Technique XPS instrument in our demonstration laboratory via the internet. We look forward to having the opportunity to renew friendships and discuss PHI’s surface analysis products with you.
For more information visit: www.avs.org