Event
PHI Webinar Series: Surface Analysis on Insulators
PLEASE CLICK TO REGISTER FOR THE EVENT!
WHEN
- Thursday, April 25, 2019 - 10:00 am (Chicago)
WHAT
- Surface Analysis on Insulators
PRESENTER
- John Newman - Director Analytical Laboratory at Physical Electronics USA
In today’s world, the majority of samples analyzed by XPS, Auger, and TOF-SIMS are non-conducting in nature. The samples are comprised of a wide variety of materials including polymers and other organics, pharmaceuticals, biological materials, OLEDs, ceramics, optical coatings, glass, semiconductors, and dielectrics for the semiconductor industry, photovoltaics, protective coatings, alternative energy materials, and the list goes on and on. Even bulk conductors often form thin insulating oxide layers on their outermost surfaces. Thus, the ability to effectively and consistently charge neutralize non-conducting samples during analysis is extremely important. This webinar will describe how Physical Electronics’ instruments charge neutralize insulating samples and discuss some of the sample mounting methods that can help minimize charging issues.