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WEBINAR ANNOUNCEMENT: Ion gun Options and Capabilities on Physical Electronics XPS Systems

Ion gun Options and Capabilities on Physical Electronics XPS Systems, presented by Dr. Ben Schmidt, Staff Scientist at Physical Electronics, USA.

The webinar will be held on Thursday, January 16 at 10:00 AM (Chicago) In this webinar, three ion beam options - monoatomic argon, C60 cluster, and argon gas cluster ion beam (GCIB) - available on XPS systems from Physical Electronics will be discussed. We will introduce the general operation of each gun and discuss capabilities and limitations for the analysis of inorganic, organic, and mixed materials. Several side-by-side examples will illustrate how sputter rates, interface resolution, chemical state information, and preferential sputtering can affect the analysis. Recommendations will be presented on how to choose the correct ion gun for your application and how combinations of ion beams can be used to optimize surface analysis experiments.

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