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SIMS XVIII

18th International Conference on Secondary Ion Mass Spectrometry Banner

Visit PHI in booths 19 & 20 at the 18th International Conference on Secondary Ion Mass Spectrometry (SIMS XVIII), to be held in Riva del Garda (Trento, Italy) from the 18th to the 23rd of September 2011. The conference will be hosted by the Riva del Garda Fierecongressi conference centre, and will provide a forum for colleagues from both academia and industries throughout the World to exchange results and new ideas on Secondary Ion Mass Spectrometry and related techniques. The conference will cover advancements of scientific knowledge from fundamentals to applications. Discussion on present possibilities and future developments of the technique, in view of the future requirements coming from technology and basic research, will be particularly solicited also with dedicated discussion sessions.

PHI presentations at SIMS XVIII will include:

"3D TOF-SIMS Characterization of Drug-Loaded Silicone Hydrogel Contact Lenses in the Frozen-Hydrated State"   a poster presentation by Dr. Greg Fisher

"3D Imaging of an Organic Matrix via FIB-TOF Tomography"  an oral presentation by Dr. Greg Fisher

"TOF-SIMS Imaging of Arabidopsis thaliana Organs and Differentiation of Epicuticular Waxes" an oral presentation by Dr. Greg Fisher

  "TOF-SIMS Characterization of In Vivo and Transdermally Treated Mouse Skin" an oral presentation by Dr. John Hammond

"Analytical Criteria to Expand the Applications of GCIB Depth Profiling with TOF-SIMS" an oral presentation by Dr. John Hammond

  Dr. John Hammond     Dr. Greg Fisher

          Dr. John Hammond                                       Dr. Greg Fisher

For more information on SIMS XVIII visit: www.simsxviii.org/

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© 2021 Physical Electronics, Inc. (PHI) All Rights Reserved.