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PHI Webinar Series: Scanning X-ray Imaging - Benefits & Capabilities from Imaging to Spectroscopy

The latest edition of PHI's Webinar series will be on Thursday, March 29.

Scanning X-ray Imaging - Benefits & Capabilities from Imaging to Spectroscopy Presented by Benjamin Schmidt

SXI imaging is a fundamental feature of PHI XPS scanning microprobe systems. As the X-ray beam is scanned across a sample, secondary electrons are collected and imaged through the same spectrometer used for XPS analysis, giving the user SEM-like navigational capabilities to locate areas of interest with complete confidence. In this webinar, learn more about the benefits of SXI and how it can aid your XPS analysis. Register below!

European Timezone - 8:00am (Chicago)

North & South American Timezone - 12:00pm (Chicago)

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© 2021 Physical Electronics, Inc. (PHI) All Rights Reserved.