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WEBINAR ANNOUNCEMENT: "TOF-SIMS 101: Introduction, Ion Beams, MS/MS, and Materials Applications”

presented by Andrew J. Giordani, Staff Scientist at Physical Electronics

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a powerful analytical technique that can provide elemental and molecular information with high sensitivity from the sample surface to tens of microns into the sample. Additionally, TOF-SIMS can produce chemical images with high spatial resolution (<70 nm). This is achieved by utilizing a variety of ion beams to either analyze (Binq+, Au nq+, C60q+, Ga+), sputter (O2+, Cs+, Ar+, large gas cluster Ar), or mill (Ga+ FIB) the sample. The most recent advancement in TOF-SIMS is the capability of MS/MS (i.e. tandem MS) which enables confident molecular identification. The flexibility of TOF-SIMS makes it a valuable tool to investigate a wide range of materials. This webinar will introduce the fundamentals of TOF-SIMS, discuss ion beams and MS/MS, and show materials applications. 

Register for the webinar here