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AVS 58th International Symposium and Exhibition

Symposium & Exhibition

Nashville Convention Center, Nashville, Tennesse - October 30 to November 4, 2011

Physical Electronics continues to be a proud Corporate Sponsor of AVS and is supporting the 58th International Symposium and Exhibition (AVS-58) as a Platinum Level Sponsor. The Symposium is a week-long forum for science and technology exchange featuring papers from technical divisions and technology groups, and topical conferences on emerging technologies. The equipment exhibition provides an excellent opportunity to view the latest products and services offered by over 200 participating companies. More than 3,000 scientists and engineers gather from around the world to attend.

Members of our technical and sales staff will be present at our booths in the Exhibition Hall and participating in the technical sessions. Visit PHI at booths 300 and 400 to see the latest innovations in our XPS, AES, and SIMS systems.

PHI’s participation in the technical sessions includes many contributed talks throughout the AVS-58 conference. We hope you will have the opportunity to attend these presentations to learn about some of the latest developments at PHI. PHI Talks include:

Tuesday, November 1, 2011 at 8:00 AM – Applied Surface Science Division Session: Takuya Miyayama (ULVAC-PHI Inc., Japan) as an invited speaker will present Recent Applications of GCIB Depth Profiling with XPS and TOF-SIMS .

Tuesday, November 1, 2011 at 11:00 AM - Nanometer-scale Science and Technology Division Session: Dr. John Hammond will present Inhomogeneous Longitudinal and Radial Dopant Distribution Measurements in Si Nanowires Using Scanning Auger .

Tuesday, November 1, 2011 at 11:20 AM - Applied Surface Science Division Session: Dr. Scott Bryan will present High Resolution TOF-SIMS Imaging of Barrier Layers in Mouse Skin Stratum Corneum .

Tuesday, November 1, 2011 at 1:20 PM - Exhibitor Technology Spotlight: Dr. John Hammond will present Advances in XPS Chemical Imaging and Depth Profiling .

Tuesday, November 1, 2011 at 6:00 PM - Applied Surface Science Poster Session: Auger Scientist, Dennis Paul, will present TiO 2 Nanotube Growth Mechanism Studied with Scanning Auger Spectroscopy .

Tuesday, November 1, 2011 at 6:00 PM - Applied Surface Science Poster Session: Sr. Lab Scientist, Saad Alnabulsi, will present Evaluation of C 60 Depth Profiling Conditions for XPS Organic Films Analysis .

Wednesday, November 2, 2011 at 5:40 PM - Tribology Focus Topic Session: Frederick Spada (University of California, San Diego), will present a collaborative talk titled Auger Surface Analysis of Deposits Formed on Magnetic Tape Recording Head Surfaces .

Thursday, November 3, 2011 at 8:00 AM - Applied Surface Science Division Session: Dr. Greg Fisher will present Imaging and Differentiation of Epicuticular Waxes on Arabidopsis thaliana Organs by TOF-SIMS .

Thursday, November 3, 2011 at 11:00 AM - Applied Surface Science Division Session: Dr. Sankar Raman will present High Resolution XPS Chemical State Imaging of Fuel Cell Membranes .

Thursday, November 3, 2011 at 11:20 AM - Applied Surface Science Division Session: Daniel J. Gaspar will present an invited collaborative talk titled Gas-Cluster Ion Beam Secondary Ion Mass Spectrometry Characterization of Thin Films for Organic Electronics Applications.

PHI’s participation at the Platinum Sponsorship level is supporting many AVS activities including Symposium Sponsorship for Applied Surface Science Division Sessions, the Welcome Mixer on Monday evening, an Exhibit Hall afternoon reception break, the Grand Prize Raffle, and one of the Daily Raffle Prize drawings. PHI also sponsors many local AVS Chapter meetings nationwide each year.

For more information regarding AVS-58 visit:  www.avs.org

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© 2021 Physical Electronics, Inc. (PHI) All Rights Reserved.