Expanding the Frontiers of Surface Analysis with Auger Electron Spectroscopy
Presented by Juergen Scherer
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Auger Electron Spectroscopy (AES) is a powerful technique for probing the top few nanometers of solid materials, delivering quantitative elemental insights with lateral resolution down to 8 nm. This surface-sensitive capability is essential for industries and research areas where thin film composition directly impacts performance—such as nanomaterials, photovoltaics, catalysis, corrosion, semiconductor devices, magnetic media, and advanced coatings.
In this webinar, we’ll explore how recent advancements in AES have transformed materials characterization. Using the PHI 710 system, integrated with tools like Focused Ion Beam (FIB) milling and complementary Energy Dispersive X-ray Spectroscopy (EDS), we’ll demonstrate how modern AES enables comprehensive analysis of complex, heterogeneous materials.
You’ll see real-world examples of:
- Rapid elemental mapping on challenging samples like lead-free solder and nanoparticles.
- High-resolution AES imaging with color overlays for clear visualization of nanoscale distributions.
- In situ cross-sectional analysis via FIB, revealing subsurface features beyond traditional surface techniques.
This multimodal approach provides unparalleled insight into both surface and subsurface chemistries, accelerating innovation in advanced materials such as aluminum alloys and battery electrodes. Join us for an engaging webinar on Auger Electron Spectroscopy (AES) and discover how cutting-edge surface analysis is transforming materials science.
