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7th European Workshop on Secondary Ion Mass Spectrometry

7th European Workshop on Secondary Ion Mass Spectroscopy

PHI will attend and exhibit at SIMS Europe 2010, the 7th European Workshop on Secondary Ion Mass Spectrometry. This workshop series was initiated in 1998 and has taken place since then by alternating with the biennial International SIMS Conferences.

PHI TOF-SIMS Scientist, Dr. Greg Fisher, will present a talk entitled Advances in 3D TOF-SIMS Imaging: From Depth Profiling to FIB Sectioning, and PHI Fellow, Dr. John Hammond, will present C60 and Gas Cluster Ion Beam Depth Profiling of Organic Materials.

Abstract: GLFisherAdvances-in-3D-TOF-SIMS-Imaging.pdf

Abstract: JSHammondC60-and-Gas-Cluster-Ion-Beam-Depth-Profiling.pdf

For more information visit the SIMS Europe 2010 website at: www.sims-europe.uni-muenster.de
 

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