Surface Analysis 2010 will be held in conjunction with the 2010 Annual Joint Symposium of the Florida Chapter of the AVS Science and Technology Society (FLAVS) and the Florida Society for Microscopy (FSM) on March 7-10, 2010 at the Student Union Building of the University of Central Florida in Orlando.

The AVS Topical Conference on Surface Analysis (SA10) and FLAVS/FSM Joint Symposium will be a three-day meeting (preceded by an afternoon session on Sunday, March 7 dedicated to student presentations).

The Symposium will consist of a plenary lecture, technical sessions with invited and contributed presentations, a poster session including a student poster competition, a science teachers workshop and an equipment exhibit for vendors to display surface analytical, vacuum, microscopy, thin film and microelectronic equipment. This symposium is sponsored by the AVS Applied Surface Science Division (ASSD).

As part of the program, on Tuesday, March 9, invited speaker, PHI TOF-SIMS Scientist, Dr. Gregory Fisher, will present a Talk in the Depth Profiling, Quantification and Data Interpretation Session entitled 3D TOF-SIMS Imaging of Organic and Inorganic Specimens with FIB Sectioning and C60 Ion Polishing.  Click on the link for Dr. Fisher's Abstract: 3D TOF-SIMS Imaging of Organic & Inorganic Specimens

For a full program schedule: Surface Analysis 2010 Program-Schedule.pdf

For more information visit: www.flavs.org

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