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Surface Analysis Technical SEMINAR 2011 - Australia

A Seminar in-collaboration between Scitek Australia Pty. Ltd. and Physical Electronics

This Seminar, titled "New Developments and Applications of TOF-SIMS, SAM and XPS for Surface, Thin Film, and 3D Analysis", is a collaboration between Scitek Australia Pty. Ltd. and Physical Electronics. This Seminar will be presented by Dr. Gregory L. Fisher and Dr. Sankar N. Raman, of Physical Electronics, and will describe the analytical capabilities and applications of the three most widely used surface analysis techniques: Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS); Scanning Auger Microscopy (SAM); and X-ray Photoelectron Spectroscopy (XPS). For each of these three techniques, the basic principles will be described followed by an overview of applications and a more detailed discussion of recent developments concerning applications with materials of significance in today’s research environment.

Sankar Raman       Greg Fisher

            Sankar Raman                                          Greg Fisher

The Seminars will all take place in early February 2011, in Australia at the following locations, dates, and times:

Date: Monday, February 7, 2011, 9:30 A.M
University of New South Wales, Sydney

Date: Tuesday, February 8, 2011, 1:00 P.M
University of Newcastle, Newcastle

Date: Wednesday, February 9, 2011, 9:30 A.M
University of Wollongong, Wollongong

Date: Thursday, February 10, 2011, 9:00 A.M
LaTrobe University, Melbourne

Date: Friday, February 11, 2011, 10:00 A.M
University of Queensland, Brisbane

18725 Lake Drive East, Chanhassen, MN 55317
© 2021 Physical Electronics, Inc. (PHI) All Rights Reserved.
© 2021 Physical Electronics, Inc. (PHI) All Rights Reserved.