Understanding Static SIMS: Its Meaning, Its Importance, and How to Identify the Static Limit
Presented by Jacob Schmidt
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Time‑of‑Flight Secondary Ion Mass Spectrometry (TOF‑SIMS) is most powerful when operated within the static limit, where the surface chemistry is measured without significantly altering it. In this webinar, we introduce the fundamental concept of static SIMS and explain why maintaining the static limit is essential for reliable molecular and elemental interpretation, particularly for organic and complex surfaces. We will discuss what the static limit physically represents, how it relates to primary ion dose and surface damage, and why exceeding it can lead to misleading chemistry. Practical strategies will be presented for identifying whether an analysis remains within the static limit, including dose calculations, experimental indicators, and common pitfalls in routine TOF‑SIMS measurements. Attendees will leave with a clearer understanding of how to design experiments that preserve true surface information and how to recognize when static SIMS conditions have been compromised.
