News & Articles
May 6, 2024
Exploring the Power of TOF-SIMS by Coupling Collision-Induced Dissociation with Surface-Induced Dissociation for Structural Analysis
February 21, 2024
XPS Insights of Fluorinated Ether Electrolyte for High Voltage Li Metal Batteries
February 7, 2024
Surface Analysis Spotlight Part 4: Concluding Perspectives on Advanced Thin Film Characterization via StrataPHI 2.0 Software
December 12, 2023
Surface Science Discoveries: Using TOF-SIMS in Quantum Computing & Battery Innovation
December 4, 2023
Surface Analysis Spotlight Part 3: What Range of Film Thickness Can StrataPHI Calculate from Angle-Resolved XPS and HAXPES Spectra?
November 10, 2023
XPS Chemical State Analysis of N-Doped Carbon Surface Coatings for Improved Battery Stability
October 25, 2023
Surface Analysis Spotlight Part 2: The StrataPHI Approach to Reconstructing the Depth Distribution of Multi-Layered Thin Films Non-Destructively
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All Rights Reserved.
© 2026 Physical Electronics, Inc. (PHI)
All Rights Reserved.