News & Articles

October 29, 2013

PHI Introduces X-tool Automated XPS Microprobe

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October 28, 2012

PHI Introduces 710 Scanning Auger Nanoprobe

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April 20, 2012

PHI European User Meeting 2012

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April 4, 2011

Update on ULVAC-PHI in Chigasaki, Japan

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March 3, 2011

MultiPak Version 9

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February 22, 2011

PHI Presentation and Workshop at Drexel University

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November 29, 2010

PHI Receives Product Award for the Gas Cluster Ion Beam (GCIB) Source

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November 9, 2010

Introducing the Gas Cluster Ion Beam Ion Gun

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November 8, 2010

PHI XPS User at PNNL/EMSL

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© 2022 Physical Electronics, Inc. (PHI) All Rights Reserved.