New TOF-SIMS Imaging MS/MS Presented @ SIMS XX

Last week at the 20th International Conference on Secondary Ion Mass Spectrometry (SIMS XX), PHI scientists authored or co-authored five papers with our collaborators from Maastricht University on the new parallel imaging MS/MS capability being developed for the PHI nanoTOF II. The following talks were presented;

A New Instrument for Parallel TOF-SIMS and MS/MS Data Acquisition, Scott R. Bryan, P.E. Larson, G.L. Fisher, J.S. Hammond, Physical Electronics, R.M.A. Heeren, Maastricht University

Imaging of Molecular Chemistry in Biological Specimens by Next-Generation TOF-SIMS, Gregory L. Fisher, Physical Electronics, N. Ogrinc Potocnik, A.L. Bruinen, B. Flinders, Maastricht University, T. Miyayama, S. Iida, ULVAC-PHI, J.S. Hammond, S.R. Bryan, Physical Electronics, R.M.A. Heeren, Maastricht University

TOF-SIMS Imaging MS/MS of Polymer Additives, John S. Hammond, P.E. Larson, G.L. Fisher, Physical Electronics, T. Miyayama, ULVAC-PHI, D.M. Carr, S.R. Bryan, Physical Electronics

Biomolecular Investigation of Neurodegenerative Diseases and Brain Plasticity with TOF-SIMS Tandem Imaging MS, Nina Ogrinc Potocnik, Maastricht University, G.L. Fisher, Physical Electronics, J. Praet, J. Hamaide, University of Antwerp, A.L. Bruinen, Maastricht University, A. Van Der Linden, University of Antwerp, R.M.A. Heeren, Maastricht University

High Resolution TOF-SIMS Tandem Imaging MS of Lipid Species in Infected Thin Tissue Sections, Anne L. Bruinen, Maastricht University, G.L. Fisher, Physical Electronics, A.M. Van Der Sar, VU University, N. Ogrinc Potocnik, R.M.A. Heeren, Maastricht University

This new capability generated a buzz at the meeting with many people making comments such as “we have needed this for years” and “I can finally identify my unknown peaks”. The new patented PHI MS/MS approach offers a major step forward compared to conventional TOF-TOF tandem mass spectrometry. In our approach, the TOF-SIMS spectrum (MS1) and the MS/MS spectrum (MS2) are acquired in parallel. This high speed TOF-TOF method allows direct comparison of peaks, images or depth profiles from MS1 and MS2 from the same analytical volume of material.

A beta version of the parallel imaging MS/MS will be installed on the PHI nanoTOF II at Maastricht University next month. PHI will collaborate with Prof. Ron Heeren’s group with a goal of releasing the commercial product in June, 2016. If you would like to learn more about this exciting new capability, contact us at

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© 2024 Physical Electronics, Inc. (PHI) All Rights Reserved.