PHI Webinar Series: Complementary XPS & TOF-SIMS Analysis

The latest in the PHI Webinar Series: Complimentary XPS & TOF-SIMS Analysis presented by Physical Electronics USA Director of Analytical Laboratory, John Newman.

WHEN: Thursday, January 10 at 10:00am (CST)

WHAT: For the characterization of polymers and organic-coated surfaces, the combination of two surface sensitive techniques - X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) can be extremely powerful. XPS provides quantitative analysis and short-range bonding chemistry from elements on the outermost surface while TOF-SIMS can provide the molecular information needed to positively identify organic species and the spatial resolution needed to show their lateral distributions on the sample surface. This presentation will discuss the complementary attributes of XPS and TOF-SIMS and demonstrate how combining the two is essential to more fully understand organic surfaces.

Watch the recording of the presentation below!

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