Physical Electronics Introduces the PHI nanoTOF
At the 53rd meeting of the American Vacuum Society, Physical Electronics will introduce its new
<em>nanoTOF</em>
Time-of Flight Secondary Ion Mass Spectrometer.
At the 53rd meeting of the American Vacuum Society, Physical Electronics will introduce its new
nanoTOF
Time-of Flight Secondary Ion Mass Spectrometer. A product of the joint Physical Electronics and ULVAC-PHI development teams the
nanoTOF
offers revolutionary new sample handling capabilities and superior ion gun performance characteristics that combined with PHI’s patented TRIFT mass
spectrometer design deliver superior performance for a broad range of TOF-SIMS applications.
To learn more about the
nanoTOF
visit the products section of this website or contact your local sales representative.
