Article

New PHI Publication in Surface Science Spectra: Description and Operating Characteristics of PHI VersaProbe XPS Instruments

Key Takeaways

• Authoritative reference for PHI VersaProbe XPS users: Provides a comprehensive, citable description of instrument geometry, operating modes, and performance across VersaProbe generations.
• Improves reproducibility in XPS publications: Defines key experimental and reporting parameters needed for transparent, repeatable XPS analysis.
• Cross‑generation operating characteristics: Compares sensitivity, energy resolution, and acquisition modes for PHI VersaProbe I, II, III, and 4 using standardized reference spectra.

This recently published Surface Science Spectra paper delivers an up‑to‑date, practical reference for users of the PHI VersaProbe family of scanning XPS microprobes. It consolidates essential details on instrument configuration, operating modes, performance characteristics, and data‑acquisition workflows, addressing limited information on the PHI VersaProbe in the published literature. By clearly defining what should be reported and how, Physical Electronics supports scientists and engineers in communicating XPS results with greater confidence, from experimental design to reporting results in peer‑reviewed publications.