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Surface Analysis Spotlight: Depth Profiling Through Individual Particles – Are You Analyzing What You Think?

Educational Series

In this Surface Analysis Spotlight, learn how to be certain that small area analysis using X-ray Photoelectron Spectroscopy (XPS)  depth profiling is done from the areas of interest, especially if rotation during sputtering is done.

Depth Profiling Through Individual Particles – Are You Analyzing What You Think?

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© 2021 Physical Electronics, Inc. (PHI) All Rights Reserved.
© 2021 Physical Electronics, Inc. (PHI) All Rights Reserved.