Article

Surface Analysis Spotlight: Using TOF-SIMS Tandem Mass Spectrometry to Determine the Surface Bonding in a Monolayer Film

Educational Series

Surface Analysis Spotlight on the identification of chemical bonding in (sub-)monolayer films by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) tandem MS imaging.

Using TOF-SIMS Tandem Mass Spectrometry to Determine the Surface Bonding in a Monolayer Film