The PHI TRIFT V nanoTOF at SAIF/RSIC, IIT, Bombay
The PHI TRIFT V
nanoTOF
Time-of-Flight Secondary Ion Mass Spectrometer (Tof-SIMS) is now commissioned at the Indian Institute of Technology (IIT), Bombay, in the
Sophisticated Analytical Instrument Facility (SAIF), formerly known as the Regional Sophisticated Instrumentation Centre (RSIC). The PHI TRIFT V
nanoTOF
is the first instrument of its kind in India. The new instrument is the latest generation of PHI's surface analysis line of ToF-SIMS instruments,
utilizing a newly developed, high-quality "TRIFT" analyzer. SAIF/RSIC, is a non-commercial lab facility founded in 1976 that houses a variety of
major analytical instruments which are operated and maintained by a dedicated and qualified group of Scientists and Engineers with a vision to be
among the top analytical instrument laboratories in the world. PHI is proud to have the TRIFT V
nanoTOF
in the SAIF facility as part of achieving this goal.
SAIF, IITB
