PHI Introduces X-tool
On
opening day at the American Vacuum Society’s
60th International Symposium and Exhibition, Physical Electronics unveiled the PHI
X-tool
as the newest XPS instrument in a suite of products that includes the PHI
Quantera
II and PHI
VersaProbe
II. The fully automated instrument will enable more widespread use of XPS instrumentation.
Based
on PHI’s
patented scanning XPS microprobe technology, the
X-tool
makes is possible for its users to perform routine small and large area XPS measurement in three easy steps. Using its intuitive touch screen user interface and automated sample loading, the
instrument can be run in either automatic mode or interactive mode, and offers automatic report generation capability. Analysis capabilities include small and large area spectroscopy, XPS mapping
and sputter depth profiling. An internal optical microscope and x-ray beam induced secondary electron imaging are available to guide the selection of areas for analysis. Users can expect the same
high level of performance from the PHI
X-tool
as they do from PHI’s
other XPS instruments, and benefit from its ultimate ease of use.
