News & Articles

December 1, 2009

Product Safety Notice: Digitel 1500 Ion Pump Control

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August 19, 2009

New National Nano Surface Characterization Facility (NNSCF) in South Africa features PHI Instruments

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June 12, 2009

SWAGELOK CENTER FOR SURFACE ANALYSIS OF MATERIALS, CWRU installs PHI TRIFT V nanoTOF

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February 4, 2008

PHI European User Meeting

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February 20, 2007

Auger Analysis of Stardust at Washington University

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November 12, 2006

Physical Electronics Introduces the PHI nanoTOF

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November 12, 2006

Physical Electronics Introduces the PHI VersaProbe

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© 2024 Physical Electronics, Inc. (PHI) All Rights Reserved.