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News & Articles

April 22, 2026

Thin Film Insights with StrataPHI 3.0 in Practice: XPS‑Based Surface Coverage and Layer Modeling

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April 20, 2026

Introducing StrataPHI 3.0 - Faster, Smarter, More Accurate Thin‑Film Insights

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March 19, 2026

Impact of PHI XPS instruments on scientific discovery

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March 17, 2026

Impact of PHI AES instruments on scientific discovery

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March 10, 2026

Coming Soon! StrataPHI 3.0: Next Generation Thin Film Intelligence

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January 29, 2026

Impact of PHI TOF-SIMS instruments on scientific discovery

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January 14, 2026

Probing the Electronic Band Structure of Emerging Chalcogenide Absorbers for Photoelectrochemistry

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December 4, 2025

Hybrid Sputtering Approach for Reliable TOF-SIMS Depth Profiling of Inorganic-Organic Multilayer Films

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October 7, 2025

How XPS and TOF-SIMS Advanced Chemical Imaging Uncovers Stabilizing Effects of Engineered Particle (Ep) Battery Cathodes

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