News & Articles
October 25, 2023
Surface Analysis Spotlight Part 2: The StrataPHI Approach to Reconstructing the Depth Distribution of Multi-Layered Thin Films Non-Destructively
October 6, 2023
Ensuring successful experiments when moving beyond XPS: a comparison of the experimental requirements for LEIPS, UPS, and REELS
September 15, 2023
Surface Analysis Spotlight Part 1: How Does Angle-Resolved X-Ray Photoelectron Spectroscopy Capture the Depth Distribution of Multi-Layered Thin Films?
September 8, 2023
In-situ XPS: Investigating Stable Interfaces for Improved Solid-State Battery Performance
June 1, 2023
Characterization of cathode-electrolyte interface in all-solid-state batteries using AES, TOF-SIMS, XPS, and UPS/LEIPS
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© 2025 Physical Electronics, Inc. (PHI)
All Rights Reserved.
© 2025 Physical Electronics, Inc. (PHI)
All Rights Reserved.