News & Articles
February 7, 2024
Surface Analysis Spotlight Part 4: Concluding Perspectives on Advanced Thin Film Characterization via StrataPHI 2.0 Software
December 12, 2023
Surface Science Discoveries: Using TOF-SIMS in Quantum Computing & Battery Innovation
December 4, 2023
Surface Analysis Spotlight Part 3: What Range of Film Thickness Can StrataPHI Calculate from Angle-Resolved XPS and HAXPES Spectra?
November 10, 2023
XPS Chemical State Analysis of N-Doped Carbon Surface Coatings for Improved Battery Stability
October 25, 2023
Surface Analysis Spotlight Part 2: The StrataPHI Approach to Reconstructing the Depth Distribution of Multi-Layered Thin Films Non-Destructively
October 6, 2023
Ensuring successful experiments when moving beyond XPS: a comparison of the experimental requirements for LEIPS, UPS, and REELS
September 15, 2023
Surface Analysis Spotlight Part 1: How Does Angle-Resolved X-Ray Photoelectron Spectroscopy Capture the Depth Distribution of Multi-Layered Thin Films?
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© 2025 Physical Electronics, Inc. (PHI)
All Rights Reserved.
© 2025 Physical Electronics, Inc. (PHI)
All Rights Reserved.