News & Articles

June 2, 2021

Surface Analysis Spotlight: Which Higher Energy X-ray Source is the Most Beneficial for Laboratory HAXPES Measurements

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May 27, 2021

New Application Note: XPS and TOF-SIMS for the Pharmaceutical Industry

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May 20, 2021

Surface Analysis Spotlight: StrataPHI: Automated Thin Film Modeling and High Throughput Metrology Tool for XPS

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May 11, 2021

StrataPHI Update

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April 27, 2021

Webinar Video on Curve Fitting in XPS: Good Practices and Tools for Avoiding Mistakes

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April 21, 2021

Surface Analysis Spotlight: Ion Guns in XPS Analysis

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April 12, 2021

New Application Note: VersaProbe III a Unique Instrument for Battery Characterization

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April 8, 2021

European/EMEA Workshop Videos

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March 18, 2021

Surface Analysis Spotlight: Challenges of XPS Depth Profiling of Mixed Materials: Organic Metal Halide Perovskites

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© 2022 Physical Electronics, Inc. (PHI) All Rights Reserved.