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News & Articles

October 25, 2021

Introducing NEW PHI VersaProbe 4

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September 24, 2021

New paper from EMPA on XPS/HAXPES analysis of solid-state interface in batteries

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August 12, 2021

Curve Fitting in XPS: Resources for Good Practices and Tools for Avoiding Mistakes

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July 13, 2021

Surface Analysis Spotlight: Hints and Methods for Use of Tandem MS in TOF-SIMS Data Reduction, Interpretation and Peak Identification

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July 2, 2021

New Paper From Our Customers at the Middle East Technical University on Perovskite Solar Cells

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June 24, 2021

Installation of a PHI Quantes at the University of the Free State

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June 2, 2021

Surface Analysis Spotlight: Which Higher Energy X-ray Source is the Most Beneficial for Laboratory HAXPES Measurements

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May 27, 2021

New Application Note: XPS and TOF-SIMS for the Pharmaceutical Industry

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May 20, 2021

Surface Analysis Spotlight: StrataPHI: Automated Thin Film Modeling and High Throughput Metrology Tool for XPS

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© 2022 Physical Electronics, Inc. (PHI) All Rights Reserved.